NanoAnalytics Imaging Contest 2024: Unleash Your Microscopic Masterpiece
Are you ready to showcase your skills in the world of Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM)? Enter the NanoAnalytics Imaging Contest 2024 and compete for top honors in nanoscale imaging!
Contest Details:
• Submission deadline: October 31, 2024.
• Categories: SEM Imaging and AFM Imaging.
Judging Criteria:
• Image features: clarity, resolution, and detail.
• Strong composition: visual impact, balance, and storytelling through the image.
Prizes: Exciting gift prizes for the winning Image!
How to Enter:
• Capture your best image: Use your expertise in SEM or AFM to create an image that
stands out.
• Submit online: Upload your image along with an exciting caption and a brief
description of the technique.
• Get featured: Selected images will be published in our online MNF Day gallery.
• Each participant can submit one image per technique (i.e. max. one SEM and one AFM
image).
Who Can Enter?
• Open to all MNF users.
• Participants must use SEM or AFM imaging techniques using MNF instruments.
Good luck and best wishes,
MNF-Day Team
