Vorsitzende der Sitzung
Session II:: Time-of-Flight- Secondary Ion Mass Spectroscopy (TOF-SIMS)
- Bonnie June Tyler
Session II:: Atomic Force Microscope (AFM)
- Riya Gupta
Session II:: Scanning Near-Field Optical Microscope (SNOM)
- Christian Gutheil
Session II:: Transmission Electron Microscope (TEM)
- Harald Rösner